TU3.R14.1

Phenology-Aware Wheat Yield Mapping with Uncertainty Estimates Using Multi-Sensor Remote Sensing

Priyanka Goyal, Adway Mitra, Indian Institute of Technology Kharagpur, India; Manjira Sinha, Tata Consultancy Services Research, India

Session:
TU3.R14: Agriculture: Precision Mapping & Nutrient Analysis III Oral

Track:
Land Applications

Location:
TBD

Presentation Time:
Tue, 11 Aug, 13:45 - 14:00

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