Lapo Miccinesi, Andrea Fini, Alessandra Beni, Andrea Cioncolini, Lorenzo Pagnini, Luca Bigazzi, Massimiliano Pieraccini, University of Florence, Italy

Deyu Song, Xiangyin Zhang, Baichuan Wang, Kai Q, University of Electronic Science and Technology of China, China

Xiaojun Li, Xidian University, China; Zhiqiang Tian, Beihang University, China; Luping Xu, Xidian University, China; Vito Pascazio, Università degli Studi di Napoli “Parthenope”, China

Jiayi Zhou, Xiangyin Zhang, University of Electronic Science and Technology of China, China; Feng Yang, Shanghai Jiao Tong University, China; Kaiyu Qin, University of Electronic Science and Technology of China, China

Jiahao Zhang, Rui Min, Jin Li, Xu Wang, Tongxu Hu, Yiming Pi, University of Electronic Science and Technology of China, China

Dongmei Deng, Southwest University of Science and Technology, China; Xuyang Sui, Beijing Institute of Technology, China; Yanan Li, Automation Research Institute Co., Ltd. of China South Industries Group Corporation, China; Dongyan Han, Xi'an Institute of Modern Control Technology, China; Jiaju Wen, Jian Zhou, Southwest University of Science and Technology, China; Jinfu Li, Beijing Institute of Technology, China

Jiayi Wang, Tianye Yu, Manqi Yang, Jing Liang, University of Electronic Science and Technology of China, China

Rita Meraz, Joan Camps-Garriga, Zachary Clayton, Stephen Frasier, University of Massachusetts Amherst, United States